Lévy noise-induced effects in a long Josephson junction in the presence of two different spatial noise distributions

We analyze the impact of Lévy-distributed stochastic fluctuations on the average switching time and voltage drop across a current-biased long Josephson tunnel junction. We compare the system’s response for two spatial configurations of time-dependent noise, i.e., homogeneous and distributed along the junction length. The response of the Josephson junction is explored by varying the characteristic parameter of the Lévy source, i.e., the 𝛼 stability index and the noise intensity. These findings offer an effective tool to characterize a Lévy component possibly embedded in an unknown noise signal.