This research is focused on the influence of defect aspect ratio on partial discharge (PD) activity within solid dielectrics subjected to direct current (DC) stress and thermal gradients. Employing finite element method (FEM) simulations by Comsol Multiphysics software, the PD inception conditions under both transient and steady-state voltage conditions was evaluated. The focus centered on investigating the effect of charge injection at the dielectric-cavity interface and the subsequent migration of these charges through the gas medium within the defect. This migration was studied through a laminar flow model considering ionized air movement within the defect, driven by the electric field. Treating the charge motion within the cavity akin to an electric current, an equivalent gas conductivity characteristic of the cavity was derived. The findings show that the shape of the defect profoundly influences the variability of equivalent gas conductivity within the defect during both voltage ramp-up and stable phases.
Giuseppe Rizzo, Antonino Madonia, Roberto Candela, Vincenzo Li Vigni, Antonino Imburgia, Pietro Romano, et al. (2024). The Role of Defect Aspect Ratio in the Partial Discharge Phenomenology under DC Voltage and Temperature Gradient. In ICD 2024 - IEEE 2024 5th International Conference on Dielectrics [10.1109/ICD59037.2024.10613234].
The Role of Defect Aspect Ratio in the Partial Discharge Phenomenology under DC Voltage and Temperature Gradient
Giuseppe Rizzo
;Antonino Madonia;Roberto Candela;Vincenzo Li Vigni;Antonino Imburgia;Pietro Romano;Alessio Di Fatta;Guido Ala
2024-06-01
Abstract
This research is focused on the influence of defect aspect ratio on partial discharge (PD) activity within solid dielectrics subjected to direct current (DC) stress and thermal gradients. Employing finite element method (FEM) simulations by Comsol Multiphysics software, the PD inception conditions under both transient and steady-state voltage conditions was evaluated. The focus centered on investigating the effect of charge injection at the dielectric-cavity interface and the subsequent migration of these charges through the gas medium within the defect. This migration was studied through a laminar flow model considering ionized air movement within the defect, driven by the electric field. Treating the charge motion within the cavity akin to an electric current, an equivalent gas conductivity characteristic of the cavity was derived. The findings show that the shape of the defect profoundly influences the variability of equivalent gas conductivity within the defect during both voltage ramp-up and stable phases.File | Dimensione | Formato | |
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