The aim of the present work is to simulate partial discharges (PDs) phenomena under voltage stress close to the Direct Current (DC) waveform. The employed waveforms have been realized by using a full-wave and a half-wave rectifiers. After that, in order to generate a steadier voltage supply, a capacitive filter has been inserted in the output of the half-wave rectifier. Simulations have been carried out by modifying a previous software used in the case of Alternating Current (AC). Finally, experimental tests have been carried out in order to validate simulation results

Andrade, M., Burgio, F., Candela, R., De Rai, L., Imburgia, A., Sanseverino, E.R., et al. (2018). Partial discharge behavior under single phase half and full-bridge rectifier. In Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP (pp. 393-396). Institute of Electrical and Electronics Engineers Inc. [10.1109/CEIDP.2017.8257618].

Partial discharge behavior under single phase half and full-bridge rectifier

Imburgia, A.
Writing – Original Draft Preparation
;
Sanseverino, E. Riva
Membro del Collaboration Group
;
Romano, P.
Writing – Review & Editing
;
Viola, F.
Membro del Collaboration Group
2018-01-01

Abstract

The aim of the present work is to simulate partial discharges (PDs) phenomena under voltage stress close to the Direct Current (DC) waveform. The employed waveforms have been realized by using a full-wave and a half-wave rectifiers. After that, in order to generate a steadier voltage supply, a capacitive filter has been inserted in the output of the half-wave rectifier. Simulations have been carried out by modifying a previous software used in the case of Alternating Current (AC). Finally, experimental tests have been carried out in order to validate simulation results
2018
9781538611944
Andrade, M., Burgio, F., Candela, R., De Rai, L., Imburgia, A., Sanseverino, E.R., et al. (2018). Partial discharge behavior under single phase half and full-bridge rectifier. In Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP (pp. 393-396). Institute of Electrical and Electronics Engineers Inc. [10.1109/CEIDP.2017.8257618].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10447/287692
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