A continuum model for GO membranes is developed in this study. The model is built representing the membrane as a two-dimensional, heterogeneous, two-phase continuum and the constitutive behavior of each phase (graphitic or oxidized) is built based on DFTB simulations of representative patches. A hyper-elastic continuum model is employed for the graphene areas, while a continuum damage model is more adequate for representing the behavior of oxidized regions. A finite element implementation for GO membranes subjected to degradation and failure is then implemented and, to avoid localization instabilities and spurious mesh sensitivity, a simple crack band model is adopted. The developed implementation is then used to investigate the existence of GO nano-representative volume elements.
Benedetti, I., Soler-crespo, R., Pedivellano, A., Gao, W., Espinosa, H. (2017). A continuum damage model for functionalized graphene membranes based on atomistic simulations. In Key Engineering Materials (pp. 173-176). Trans Tech Publications Ltd [10.4028/www.scientific.net/KEM.754.173].
A continuum damage model for functionalized graphene membranes based on atomistic simulations
Benedetti, I.;
2017-09-01
Abstract
A continuum model for GO membranes is developed in this study. The model is built representing the membrane as a two-dimensional, heterogeneous, two-phase continuum and the constitutive behavior of each phase (graphitic or oxidized) is built based on DFTB simulations of representative patches. A hyper-elastic continuum model is employed for the graphene areas, while a continuum damage model is more adequate for representing the behavior of oxidized regions. A finite element implementation for GO membranes subjected to degradation and failure is then implemented and, to avoid localization instabilities and spurious mesh sensitivity, a simple crack band model is adopted. The developed implementation is then used to investigate the existence of GO nano-representative volume elements.File | Dimensione | Formato | |
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FDM2017 - Graphene Oxide Modelling - Benedetti Espinosa - Proceedings.pdf
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