CdZnTe detectors are commonly exploited for the detection of gamma rays. However, obtaining mechanical stable, low noise contacts on CdZnTe is still an issue. In particular, ohmic contacts would be preferable for high flux applications. In this work, we show that it is possible to obtain mechanical stable gold contacts by electroless deposition in methanol solution. Moreover, we show that electroless deposited nickel contacts are also mechanical stable and are good candidates for the realization of ohmic contacts on high resistivity CdZnTe crystals.

Bettelli, M., Benassi, G., Nasi, L., Zambelli, N., Zappettini, A., Gombia, E., et al. (2016). Mechanically stable metal layers for ohmic and blocking contacts on CdZnTe detectors by electroless deposition. In 2015 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2015 (pp. 1-3). Institute of Electrical and Electronics Engineers Inc. [10.1109/NSSMIC.2015.7582259].

Mechanically stable metal layers for ohmic and blocking contacts on CdZnTe detectors by electroless deposition

ABBENE, Leonardo;PRINCIPATO, Fabio;
2016-10-01

Abstract

CdZnTe detectors are commonly exploited for the detection of gamma rays. However, obtaining mechanical stable, low noise contacts on CdZnTe is still an issue. In particular, ohmic contacts would be preferable for high flux applications. In this work, we show that it is possible to obtain mechanical stable gold contacts by electroless deposition in methanol solution. Moreover, we show that electroless deposited nickel contacts are also mechanical stable and are good candidates for the realization of ohmic contacts on high resistivity CdZnTe crystals.
ott-2016
Settore FIS/01 - Fisica Sperimentale
Settore FIS/07 - Fisica Applicata(Beni Culturali, Ambientali, Biol.e Medicin)
9781467398626
Bettelli, M., Benassi, G., Nasi, L., Zambelli, N., Zappettini, A., Gombia, E., et al. (2016). Mechanically stable metal layers for ohmic and blocking contacts on CdZnTe detectors by electroless deposition. In 2015 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2015 (pp. 1-3). Institute of Electrical and Electronics Engineers Inc. [10.1109/NSSMIC.2015.7582259].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10447/210763
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