Highly localized THz emission via optical rectification in thin nonlinear crystals is a promising method for subwavelength microscopy. We present here the peculiar THz spatio-temporal characteristics induced by the non-paraxial generation regime.

Phing Ho, S., Clerici, M., Peccianti, M., Buccheri, F., Busacca, A., Ozaki, T., et al. (2011). Spatio-temporal Characteristics of THz Emission at the Subwavelength Scale via Optical Rectification. In Proceedings of Optical Sensors: THz Spectroscopy and Imaging Applications.

Spatio-temporal Characteristics of THz Emission at the Subwavelength Scale via Optical Rectification

BUSACCA, Alessandro;
2011-01-01

Abstract

Highly localized THz emission via optical rectification in thin nonlinear crystals is a promising method for subwavelength microscopy. We present here the peculiar THz spatio-temporal characteristics induced by the non-paraxial generation regime.
2011
978-1-55752-913-8
Phing Ho, S., Clerici, M., Peccianti, M., Buccheri, F., Busacca, A., Ozaki, T., et al. (2011). Spatio-temporal Characteristics of THz Emission at the Subwavelength Scale via Optical Rectification. In Proceedings of Optical Sensors: THz Spectroscopy and Imaging Applications.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10447/104819
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