Highly localized THz emission via optical rectification in thin nonlinear crystals is a promising method for subwavelength microscopy. We present here the peculiar THz spatio-temporal characteristics induced by the non-paraxial generation regime.
Phing Ho, S., Clerici, M., Peccianti, M., Buccheri, F., Busacca, A., Ozaki, T., et al. (2011). Spatio-temporal Characteristics of THz Emission at the Subwavelength Scale via Optical Rectification. In Proceedings of Optical Sensors: THz Spectroscopy and Imaging Applications.
Spatio-temporal Characteristics of THz Emission at the Subwavelength Scale via Optical Rectification
BUSACCA, Alessandro;
2011-01-01
Abstract
Highly localized THz emission via optical rectification in thin nonlinear crystals is a promising method for subwavelength microscopy. We present here the peculiar THz spatio-temporal characteristics induced by the non-paraxial generation regime.File in questo prodotto:
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