Pixelated Schottky Al/p-CdTe/Pt detectors are very attractive devices for high-resolution Xray spectroscopic imaging, even though they suffer from bias-induced time instability (polarization). In this work, we present the results of the electrical characterization of a (4x4) pixelated Schottky Al/p- CdTe/Pt detector. Current-voltage (I-V) characteristics and current transients were investigated at different temperatures. The results show as deep levels play a dominant role in the charge transport mechanism. The conduction mechanism is dominated by the space charge limited current (SCLC) both under forward bias and at high reverse bias. Schottky barrier height of the Al/CdTe contact was estimated by using the thermionic-field emission model at low reverse bias voltages. Activation energy of the deep levels was measured through the analysis of the reverse current transients at different temperatures. Finally, we employed an analytical method to determine the density and the energy distribution of the traps from SCLC current-voltage characteristics.

Turturici, A.A., Abbene, L., Gerardi, G., & Principato, F. (2014). Electrical Characterization of CdTe pixel detectors with Al Schottky anode. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT, 763(763), 476-482 [http://dx.doi.org/10.1016/j.nima.2014.07.011].

Electrical Characterization of CdTe pixel detectors with Al Schottky anode

TURTURICI, Accursio Antonio;ABBENE, Leonardo;GERARDI, Gaetano;PRINCIPATO, Fabio
2014

Abstract

Pixelated Schottky Al/p-CdTe/Pt detectors are very attractive devices for high-resolution Xray spectroscopic imaging, even though they suffer from bias-induced time instability (polarization). In this work, we present the results of the electrical characterization of a (4x4) pixelated Schottky Al/p- CdTe/Pt detector. Current-voltage (I-V) characteristics and current transients were investigated at different temperatures. The results show as deep levels play a dominant role in the charge transport mechanism. The conduction mechanism is dominated by the space charge limited current (SCLC) both under forward bias and at high reverse bias. Schottky barrier height of the Al/CdTe contact was estimated by using the thermionic-field emission model at low reverse bias voltages. Activation energy of the deep levels was measured through the analysis of the reverse current transients at different temperatures. Finally, we employed an analytical method to determine the density and the energy distribution of the traps from SCLC current-voltage characteristics.
Settore FIS/01 - Fisica Sperimentale
Settore FIS/07 - Fisica Applicata(Beni Culturali, Ambientali, Biol.e Medicin)
Settore FIS/03 - Fisica Della Materia
Turturici, A.A., Abbene, L., Gerardi, G., & Principato, F. (2014). Electrical Characterization of CdTe pixel detectors with Al Schottky anode. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT, 763(763), 476-482 [http://dx.doi.org/10.1016/j.nima.2014.07.011].
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/10447/95366
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