Atomic force microscopy (AFM) is probably the most celebrated technique falling into the family of experimental methods known as scanning probe microscopy. AFM is primarily designed to obtain the morphology of the surface of a solid material by using the force of interaction between an inert probe and the sample. The AFM microscope can generally be operated in many ways for morphology investigations, but they can be roughly classified into two main groups: static- and dynamic-deflection modes. Since atomic force microscopy makes use of tip-surface interaction to reconstruct the surface morphology of materials, it is of fundamental importance to fully understand the nature and properties of these forces. AFM spectroscopy consists in the experimental determination and analysis of the curve representing the interaction force between tip and sample as a function of their mutual distance.

Buscarino G. (2021). Atomic Force Microscopy and Spectroscopy. In A. Simonpietro (a cura di), Spectroscopy for Materials Characterization (pp. 425-460). wiley [10.1002/9781119698029.ch15].

Atomic Force Microscopy and Spectroscopy

Buscarino G.
Primo
2021-07-26

Abstract

Atomic force microscopy (AFM) is probably the most celebrated technique falling into the family of experimental methods known as scanning probe microscopy. AFM is primarily designed to obtain the morphology of the surface of a solid material by using the force of interaction between an inert probe and the sample. The AFM microscope can generally be operated in many ways for morphology investigations, but they can be roughly classified into two main groups: static- and dynamic-deflection modes. Since atomic force microscopy makes use of tip-surface interaction to reconstruct the surface morphology of materials, it is of fundamental importance to fully understand the nature and properties of these forces. AFM spectroscopy consists in the experimental determination and analysis of the curve representing the interaction force between tip and sample as a function of their mutual distance.
Settore FIS/01 - Fisica Sperimentale
https://onlinelibrary.wiley.com/doi/10.1002/9781119698029.ch15
Buscarino G. (2021). Atomic Force Microscopy and Spectroscopy. In A. Simonpietro (a cura di), Spectroscopy for Materials Characterization (pp. 425-460). wiley [10.1002/9781119698029.ch15].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10447/576608
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