We propose a new sensing device based on all-optical nano-objects placed in a suspended periodic array. We demonstrate that the intensity-based sensing mechanism can measure environment refractive index change of the order of 1.8×10^−6, which is close to record efficiencies in plasmonic devices.

Tognazzi, A., Rocco, D., Gandolfi, M., Locatelli, A., Carletti, L., De Angelis, C. (2021). High Quality Factor Silicon Membrane Metasurface for Intensity-Based Refractive Index Sensing. OPTICS, 2(3), 193-199 [10.3390/opt2030018].

High Quality Factor Silicon Membrane Metasurface for Intensity-Based Refractive Index Sensing

Tognazzi, Andrea
Primo
;
2021-09-06

Abstract

We propose a new sensing device based on all-optical nano-objects placed in a suspended periodic array. We demonstrate that the intensity-based sensing mechanism can measure environment refractive index change of the order of 1.8×10^−6, which is close to record efficiencies in plasmonic devices.
6-set-2021
Settore ING-INF/02 - Campi Elettromagnetici
Tognazzi, A., Rocco, D., Gandolfi, M., Locatelli, A., Carletti, L., De Angelis, C. (2021). High Quality Factor Silicon Membrane Metasurface for Intensity-Based Refractive Index Sensing. OPTICS, 2(3), 193-199 [10.3390/opt2030018].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10447/547697
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