A cheap, compact and customisable characterisation system for memristor devices, working between ±10 V, is presented. SPICE (Simulation Program with Integrated Circuit Emphasis) simulations are performed to verify the circuit feasibility and a proper software is developed to drive the system. The potentiality of the realised system is tested by performing several electrical measurements on both Cu/HfO2/Pt memristors and two-terminals commercial devices.
Lupo, F., Scirè, D., Mosca, M., Crupi, I., Razzari, L., Macaluso, R. (2021). Custom measurement system for memristor characterisation. SOLID-STATE ELECTRONICS, 186 [10.1016/j.sse.2021.108049].
Custom measurement system for memristor characterisation
Lupo, F. V.
;Scirè, D.;Mosca, M.;Crupi, I.;Macaluso, R.
2021-12-01
Abstract
A cheap, compact and customisable characterisation system for memristor devices, working between ±10 V, is presented. SPICE (Simulation Program with Integrated Circuit Emphasis) simulations are performed to verify the circuit feasibility and a proper software is developed to drive the system. The potentiality of the realised system is tested by performing several electrical measurements on both Cu/HfO2/Pt memristors and two-terminals commercial devices.
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