Domain engineering technology in lithium tantalate is a well studied approach for nonlinear optical applications. However, for several cases of interest, the realization of short period structures (<2 μm) is required, which make their characterization difficult with standard techniques. In this work, we show that high resolution x-ray diffraction is a convenient approach for the characterization of such structures, allowing us to obtain in a nondestructive fashion information such as the average domain period, the domain wall inclination, and the overall structure quality.
|Data di pubblicazione:||2009|
|Titolo:||High resolution x-ray investigation of periodically poled lithium tantalate crystals with short periodicity|
|Citazione:||Bazzan, M., Sada, C., Argiolas, N., Busacca, A., Oliveri, R., Stivala, S., et al. (2009). High resolution x-ray investigation of periodically poled lithium tantalate crystals with short periodicity. JOURNAL OF APPLIED PHYSICS, 106(10).|
|Digital Object Identifier (DOI):||10.1063/1.3264620|
|Appare nelle tipologie:||1.01 Articolo in rivista|