Domain engineering technology in lithium tantalate is a well studied approach for nonlinear optical applications. However, for several cases of interest, the realization of short period structures (<2 μm) is required, which make their characterization difficult with standard techniques. In this work, we show that high resolution x-ray diffraction is a convenient approach for the characterization of such structures, allowing us to obtain in a nondestructive fashion information such as the average domain period, the domain wall inclination, and the overall structure quality.
Bazzan, M., Sada, C., Argiolas, N., Busacca, A., Oliveri, R.L., Stivala, S., et al. (2009). High resolution x-ray investigation of periodically poled lithium tantalate crystals with short periodicity. JOURNAL OF APPLIED PHYSICS, 106(10) [10.1063/1.3264620].
High resolution x-ray investigation of periodically poled lithium tantalate crystals with short periodicity
BUSACCA, Alessandro;OLIVERI, Roberto Luigi;STIVALA, Salvatore;CURCIO, Luciano;RIVA SANSEVERINO, Stefano
2009-01-01
Abstract
Domain engineering technology in lithium tantalate is a well studied approach for nonlinear optical applications. However, for several cases of interest, the realization of short period structures (<2 μm) is required, which make their characterization difficult with standard techniques. In this work, we show that high resolution x-ray diffraction is a convenient approach for the characterization of such structures, allowing us to obtain in a nondestructive fashion information such as the average domain period, the domain wall inclination, and the overall structure quality.
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