The high-spectral-resolution detection of hard X-rays (E > 20 keV) is a challenging and nearly unexplored area in space astrophysics. Traditionally hard X-ray detectors present moderate spectral resolutions, although few tens of eV one could open new frontiers in the study of nuclear processes and high-temperature plasma dynamics in energetic processes. This can be achieved by using cryogenic microcalorimeters. Within a research activity aimed at developing arrays of neutron transmutation-doped germanium (NTD-Ge) microcalorimeters for the high-spectral-resolution detection (about 50 eV@60 keV) of hard X-rays (20 keV < E<100 keV), we developed an electroplating process to fabricate high-thickness (> 60 μm) bismuth absorber arrays. The adopted technological process and the study of related process parameters are discussed; preliminary results on produced arrays are given.

Ferruggia Bonura, S., Gulli, D., Barbera, M., Collura, A., Spoto, D., Vassallo, P., et al. (2020). Fabrication of Bismuth Absorber Arrays for NTD-Ge Hard X-ray Microcalorimeters. JOURNAL OF LOW TEMPERATURE PHYSICS, 200, 336-341 [10.1007/s10909-020-02475-6].

Fabrication of Bismuth Absorber Arrays for NTD-Ge Hard X-ray Microcalorimeters

Ferruggia Bonura, S.
;
Gulli, D.;Barbera, M.;Santamaria, M.;Di Franco, F.;Zaffora, A.;Botta, L.;Lo Cicero, U.
2020-01-01

Abstract

The high-spectral-resolution detection of hard X-rays (E > 20 keV) is a challenging and nearly unexplored area in space astrophysics. Traditionally hard X-ray detectors present moderate spectral resolutions, although few tens of eV one could open new frontiers in the study of nuclear processes and high-temperature plasma dynamics in energetic processes. This can be achieved by using cryogenic microcalorimeters. Within a research activity aimed at developing arrays of neutron transmutation-doped germanium (NTD-Ge) microcalorimeters for the high-spectral-resolution detection (about 50 eV@60 keV) of hard X-rays (20 keV < E<100 keV), we developed an electroplating process to fabricate high-thickness (> 60 μm) bismuth absorber arrays. The adopted technological process and the study of related process parameters are discussed; preliminary results on produced arrays are given.
2020
Ferruggia Bonura, S., Gulli, D., Barbera, M., Collura, A., Spoto, D., Vassallo, P., et al. (2020). Fabrication of Bismuth Absorber Arrays for NTD-Ge Hard X-ray Microcalorimeters. JOURNAL OF LOW TEMPERATURE PHYSICS, 200, 336-341 [10.1007/s10909-020-02475-6].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10447/438698
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