We studied ultrafast relaxation of localized excited states at Ge-related oxygen deficient centers in silica using femtosecond transient-absorption spectroscopy. The relaxation dynamics exhibits a biexponential decay, which we ascribe to the departure from the Frank–Condon region of the first excited singlet state in 240 fs, followed by cooling in ~10 ps. At later times, a nonexponential relaxation spanning up to 40 ns occurs, which is fitted with an inhomogeneous distribution of nonradiative relaxation rates, following a chi-square distribution with one degree of freedom. This reveals several analogies with phenomena such as neutron reactions, quantum dot blinking, or intramolecular vibrational redistribution. © 2008 American Institute of Physics. [DOI: 10.1063/1.2975965]

Cannizzo, A., Leone, M., Gawelda, W., PORTUONDO CAMPA, E., Callegari, A., VAN MOURIK, F., et al. (2008). Relaxation processes of point defects in vitreous silica from femtosecond to nanoseconds. APPLIED PHYSICS LETTERS, 93, 102901_1-102901_3 [10.1063/1.2975965].

Relaxation processes of point defects in vitreous silica from femtosecond to nanoseconds

LEONE, Maurizio;
2008-01-01

Abstract

We studied ultrafast relaxation of localized excited states at Ge-related oxygen deficient centers in silica using femtosecond transient-absorption spectroscopy. The relaxation dynamics exhibits a biexponential decay, which we ascribe to the departure from the Frank–Condon region of the first excited singlet state in 240 fs, followed by cooling in ~10 ps. At later times, a nonexponential relaxation spanning up to 40 ns occurs, which is fitted with an inhomogeneous distribution of nonradiative relaxation rates, following a chi-square distribution with one degree of freedom. This reveals several analogies with phenomena such as neutron reactions, quantum dot blinking, or intramolecular vibrational redistribution. © 2008 American Institute of Physics. [DOI: 10.1063/1.2975965]
2008
Settore FIS/07 - Fisica Applicata(Beni Culturali, Ambientali, Biol.e Medicin)
Cannizzo, A., Leone, M., Gawelda, W., PORTUONDO CAMPA, E., Callegari, A., VAN MOURIK, F., et al. (2008). Relaxation processes of point defects in vitreous silica from femtosecond to nanoseconds. APPLIED PHYSICS LETTERS, 93, 102901_1-102901_3 [10.1063/1.2975965].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10447/41419
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