A methodology developed for active testing of electronic devices under radiations is presented. The test setup includes a gamma-ray facility, hardware board/fixtures and software tools purposely designed and realized. The methodology is so wide-ranging to allow us the verification of different classes of electronic devices, even if only application examples for Static Random Access Memory (SRAM) modules are reported.
A. Parlato, E. Tomarchio, C. Calligaro, C. Pace (2018). A methodology for Active Testing of Electronic Devices under Radiations. NUCLEAR TECHNOLOGY & RADIATION PROTECTION, 33(1), 53-60 [10.2298/NTRP1801053P].
A methodology for Active Testing of Electronic Devices under Radiations
A. Parlato;E. Tomarchio;
2018-01-01
Abstract
A methodology developed for active testing of electronic devices under radiations is presented. The test setup includes a gamma-ray facility, hardware board/fixtures and software tools purposely designed and realized. The methodology is so wide-ranging to allow us the verification of different classes of electronic devices, even if only application examples for Static Random Access Memory (SRAM) modules are reported.
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