Partially resolved x-ray spectra of highly charged krypton ions (Kr) was analyzed using an electron-beam ion trap (EBIT) plasma model. A microcalorimeter detector recorded the spectra in a broad x-ray energy band. Charge state distributions of krypton ions inside the EBIT was determined. In addition, the transition energies of the spectral lines were determined with some uncertainty. Many new lines in the spectra of L-shell Kr ions were identified with some diagnostic potential applicable in plasma physics.
Kink, I., Laming, J., Takács, E., Porto, J., Gillaspy, J., Silver, E., et al. (2001). Analysis of broadband x-ray spectra of highly charged krypton from a microcalorimeter detector of an electron-beam ion trap. PHYSICAL REVIEW E, STATISTICAL, NONLINEAR, AND SOFT MATTER PHYSICS, 63(4 II), 1-10 [10.1103/PhysRevE.63.046409].
Analysis of broadband x-ray spectra of highly charged krypton from a microcalorimeter detector of an electron-beam ion trap
BARBERA, Marco;
2001-01-01
Abstract
Partially resolved x-ray spectra of highly charged krypton ions (Kr) was analyzed using an electron-beam ion trap (EBIT) plasma model. A microcalorimeter detector recorded the spectra in a broad x-ray energy band. Charge state distributions of krypton ions inside the EBIT was determined. In addition, the transition energies of the spectral lines were determined with some uncertainty. Many new lines in the spectra of L-shell Kr ions were identified with some diagnostic potential applicable in plasma physics.File | Dimensione | Formato | |
---|---|---|---|
Kink_et_al_PhysRevE_63_046409.pdf
Solo gestori archvio
Dimensione
282.61 kB
Formato
Adobe PDF
|
282.61 kB | Adobe PDF | Visualizza/Apri Richiedi una copia |
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.