We report a systematic study of time-resolved and power-dependent photoresponse in high-efficiency germanium quantum dot photodetectors (Ge-QD PDs), with internal quantum efficiencies greater than 100 over a broad wavelength, reverse bias, and incident power range. Turn-on and turn-off response times (τ on and τ off) are shown to depend on series resistance, bias, optical power, and thickness (W QD) of the Ge-QD layer, with measured τ off values down to ∼40 ns. Two different photoconduction regimes are observed at low and high reverse bias, with a transition around -3 V. A transient current overshoot phenomenon is also observed, which depends on bias and illumination power. © 2012 American Institute of Physics.
Liu, P., Cosentino, S., Le, S., Lee, S., Paine, D., Zaslavsky, A., et al. (2012). Transient photoresponse and incident power dependence of high-efficiency germanium quantum dot photodetectors. JOURNAL OF APPLIED PHYSICS, 112(8) [10.1063/1.4759252].
Transient photoresponse and incident power dependence of high-efficiency germanium quantum dot photodetectors
crupi, Isodiana;
2012-01-01
Abstract
We report a systematic study of time-resolved and power-dependent photoresponse in high-efficiency germanium quantum dot photodetectors (Ge-QD PDs), with internal quantum efficiencies greater than 100 over a broad wavelength, reverse bias, and incident power range. Turn-on and turn-off response times (τ on and τ off) are shown to depend on series resistance, bias, optical power, and thickness (W QD) of the Ge-QD layer, with measured τ off values down to ∼40 ns. Two different photoconduction regimes are observed at low and high reverse bias, with a transition around -3 V. A transient current overshoot phenomenon is also observed, which depends on bias and illumination power. © 2012 American Institute of Physics.File | Dimensione | Formato | |
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