Passive films on AISI 316L stainless steel were grown by exposure in high temperature (300 °C and 150 bar) water. X-ray photoelectron spectroscopy was employed to study their composition as a function of immersion time. A photoelectrochemical investigation, supported by electrochemical and impedance measurements, allowed to get information on the solid-state properties of the investigated layers. The experimental results suggest the formation of a stratified layer with an outer iron-rich layer and an inner Cr-rich oxide layer, whose relative thickness and composition are dependent on the immersion time.
Santamaria, M., Di Franco, F., Di Quarto, F., Pisarek, M., Zanna, S., Marcus, P. (2015). Photoelectrochemical and XPS characterisation of oxide layers on 316L stainless steel grown in high-temperature water. JOURNAL OF SOLID STATE ELECTROCHEMISTRY, 19(12), 3511-3519 [10.1007/s10008-015-2849-0].
Photoelectrochemical and XPS characterisation of oxide layers on 316L stainless steel grown in high-temperature water
SANTAMARIA, Monica;DI FRANCO, Francesco;DI QUARTO, Francesco;
2015-01-01
Abstract
Passive films on AISI 316L stainless steel were grown by exposure in high temperature (300 °C and 150 bar) water. X-ray photoelectron spectroscopy was employed to study their composition as a function of immersion time. A photoelectrochemical investigation, supported by electrochemical and impedance measurements, allowed to get information on the solid-state properties of the investigated layers. The experimental results suggest the formation of a stratified layer with an outer iron-rich layer and an inner Cr-rich oxide layer, whose relative thickness and composition are dependent on the immersion time.
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