Continuous-wave electron paramagnetic resonance (EPR) spectroscopy has been the technique of choice for the studies of radiation-induced defects in silica (SiO2) for 60 years, and has recently been expanded to include more sophisticated techniques such as high-frequency EPR, pulse electron nuclear double resonance (ENDOR), and pulse electron spin echo envelope modulation (ESEEM) spectroscopy. Structural models of radiation-induced defects obtained from single-crystal EPR analyses of crystalline SiO2 (alfa-quartz) are often applicable to their respective analogues in amorphous silica (a-SiO2), although significant differences are common.

Alessi, A., Agnello, S., Buscarino, G., Pan, Y., & Mashkovtsev, R. (2014). EPR on Radiation-Induced Defects in SiO2. In Applications of EPR in Radiation Research (pp. 255-295). Springer [10.1007/978-3-319-09216-4].

EPR on Radiation-Induced Defects in SiO2

ALESSI, Antonino;AGNELLO, Simonpietro;BUSCARINO, Gianpiero;
2014

Abstract

Continuous-wave electron paramagnetic resonance (EPR) spectroscopy has been the technique of choice for the studies of radiation-induced defects in silica (SiO2) for 60 years, and has recently been expanded to include more sophisticated techniques such as high-frequency EPR, pulse electron nuclear double resonance (ENDOR), and pulse electron spin echo envelope modulation (ESEEM) spectroscopy. Structural models of radiation-induced defects obtained from single-crystal EPR analyses of crystalline SiO2 (alfa-quartz) are often applicable to their respective analogues in amorphous silica (a-SiO2), although significant differences are common.
Settore FIS/01 - Fisica Sperimentale
Alessi, A., Agnello, S., Buscarino, G., Pan, Y., & Mashkovtsev, R. (2014). EPR on Radiation-Induced Defects in SiO2. In Applications of EPR in Radiation Research (pp. 255-295). Springer [10.1007/978-3-319-09216-4].
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/10447/105689
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