PERSANO ADORNO D, MC CAPIZZO, M ZARCONE (2006). Monte Carlo Analysis of Voltage-Current Characterstic Nonlinearity and Harmonic Generation in Submicron Semiconductor Structures. In Proceedings of the 25th IEEE International Conference on Microelectronics (MIEL 2006) (pp.497-500).

Monte Carlo Analysis of Voltage-Current Characterstic Nonlinearity and Harmonic Generation in Submicron Semiconductor Structures

PERSANO ADORNO, Dominique;CAPIZZO, Maria Concetta;ZARCONE, Michelangelo
2006-01-01

Proceedings of the 25th IEEE International Conference on Microelectronics (MIEL 2006)
2006
Published by the Electron Devices Society of the Institute of Electrcal and Electronics Engineers, INC.
PERSANO ADORNO D, MC CAPIZZO, M ZARCONE (2006). Monte Carlo Analysis of Voltage-Current Characterstic Nonlinearity and Harmonic Generation in Submicron Semiconductor Structures. In Proceedings of the 25th IEEE International Conference on Microelectronics (MIEL 2006) (pp.497-500).
Proceedings (atti dei congressi)
PERSANO ADORNO D; MC CAPIZZO; M ZARCONE
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10447/7871
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