In this paper a novel approach to model partial discharges (PD) activity taking place inside a spherical void in epoxy resin system has been traced. The approach is based on a time varying conductance of the inner void, subjected to multistress conditions: voltage, temperature and pressure. A simple lumped circuit macro-model simulates the global effects of PD activity: the different parameters influencing the discharge phenomenon in the void are taking into account by using a physical approach resulting in a time varying conductance inside the circuit. The evaluated PD activity has been compared with experimental and simulated one for the accessible and inaccessible part of the system. A discussion on the observed changes in PD activity has been reported.
Ala, G., Candela, R., Romano, P., Viola, F. (2011). Simplified Hybrid PD Model in Voids. In 8th IEEE Symposium on Diagnostics for Electrical Machines, Power Electronics & Drives (pp.451-455). IEEE [10.1109/DEMPED.2011.6063662].
Simplified Hybrid PD Model in Voids
ALA, Guido;CANDELA, Roberto;ROMANO, Pietro;VIOLA, Fabio
2011-01-01
Abstract
In this paper a novel approach to model partial discharges (PD) activity taking place inside a spherical void in epoxy resin system has been traced. The approach is based on a time varying conductance of the inner void, subjected to multistress conditions: voltage, temperature and pressure. A simple lumped circuit macro-model simulates the global effects of PD activity: the different parameters influencing the discharge phenomenon in the void are taking into account by using a physical approach resulting in a time varying conductance inside the circuit. The evaluated PD activity has been compared with experimental and simulated one for the accessible and inaccessible part of the system. A discussion on the observed changes in PD activity has been reported.File | Dimensione | Formato | |
---|---|---|---|
simplified hybrid PD model in voids_pdf.pdf
Solo gestori archvio
Dimensione
179.96 kB
Formato
Adobe PDF
|
179.96 kB | Adobe PDF | Visualizza/Apri Richiedi una copia |
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.