We studied the effects of dielectric change in the chemical composition and in the realization procedures under radiation exposure. We have compared the radiation effects on Ge-doped and F-doped fibers and preforms: the first play a crucial role in the photosensitivity property, the second improves the dielectric radiation hardness even at low concentrations. The use of different spectroscopic techniques (RIA, OA, EPR) allow the identification of the point defect formation mechanisms at the origin of the optical degradation properties.
Origlio, G., Girard, S., Boscaino, R., Boukenter, A., Cannas, M., Ouerdane, Y. (2009). Optical and photonic material hardness for energetic environments. In UVX 2008 - 9e Colloque sur les Sources Cohérentes et Incohérentes UV, VUV et X : Applications et Développements Récents (pp.127-132). EDP sciences [10.1051/uvx/2009020].
Optical and photonic material hardness for energetic environments
BOSCAINO, Roberto;CANNAS, Marco;
2009-01-01
Abstract
We studied the effects of dielectric change in the chemical composition and in the realization procedures under radiation exposure. We have compared the radiation effects on Ge-doped and F-doped fibers and preforms: the first play a crucial role in the photosensitivity property, the second improves the dielectric radiation hardness even at low concentrations. The use of different spectroscopic techniques (RIA, OA, EPR) allow the identification of the point defect formation mechanisms at the origin of the optical degradation properties.File | Dimensione | Formato | |
---|---|---|---|
uvx08020.pdf
Solo gestori archvio
Descrizione: pdf
Dimensione
595.11 kB
Formato
Adobe PDF
|
595.11 kB | Adobe PDF | Visualizza/Apri Richiedi una copia |
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.