The new proposed method of pattern recognition is based on the application of Multi-resolution Signal Decomposition (MSD) technique of wavelet transform. This technique has showed off interesting properties in capturing the embedded horizontal, vertical and diagonal variations within an image obtained from the PD pattern in a separable form. This feature was exploited to identify in the PD pattern's MSD, relative at various family of partial discharge sources, some detail images typical of a single discharge phenomenon. The classification of a generic PD phenomenon is feasible through a comparison between its detail images and the detail images typical of a single discharge phenomenon. Tests have been performed on specimens having single defects. The obtained results prove that the proposed improved classification methods is quite efficient and accurate. ©2006 IEEE.

Abate, A., Buccheri, P., Candela, R., Romano, P., Testa, L. (2007). An improved MSD-based method for PD defects classification. In Proceedings of the IEEE International Conference on Properties and Applications of Dielectric Materials (pp.669-672) [10.1109/ICPADM.2006.284266].

An improved MSD-based method for PD defects classification

Romano, P.
Writing – Review & Editing
;
2007-01-01

Abstract

The new proposed method of pattern recognition is based on the application of Multi-resolution Signal Decomposition (MSD) technique of wavelet transform. This technique has showed off interesting properties in capturing the embedded horizontal, vertical and diagonal variations within an image obtained from the PD pattern in a separable form. This feature was exploited to identify in the PD pattern's MSD, relative at various family of partial discharge sources, some detail images typical of a single discharge phenomenon. The classification of a generic PD phenomenon is feasible through a comparison between its detail images and the detail images typical of a single discharge phenomenon. Tests have been performed on specimens having single defects. The obtained results prove that the proposed improved classification methods is quite efficient and accurate. ©2006 IEEE.
Settore ING-IND/31 - Elettrotecnica
27-giu-2006
ICPADM 2006 - 8th International Conference on Properties and Applications of Dielectric Materials
Bali, idn
2006
2007
4
Online
Abate, A., Buccheri, P., Candela, R., Romano, P., Testa, L. (2007). An improved MSD-based method for PD defects classification. In Proceedings of the IEEE International Conference on Properties and Applications of Dielectric Materials (pp.669-672) [10.1109/ICPADM.2006.284266].
Proceedings (atti dei congressi)
Abate, A.; Buccheri, P.; Candela, R.; Romano, P.; Testa, L.
File in questo prodotto:
File Dimensione Formato  
An improved MSD-based method for PD defects classification.pdf

Solo gestori archvio

Descrizione: Full paper
Dimensione 3.48 MB
Formato Adobe PDF
3.48 MB Adobe PDF   Visualizza/Apri   Richiedi una copia

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10447/247421
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 1
  • ???jsp.display-item.citation.isi??? 0
social impact