Novel diamond X-ray detectors with patterned reduced graphene oxide contacts

A novel kind of detector based on polycrystalline grade diamond substrate and Reduced Graphene Oxide (RGO) contacts is presented. This detector combines some of the good qualities of diamond (i.e. radiation hardness and almost unique combination of electric, thermal and optical properties) with low- Z contacts. This characteristic together with the possibility of patterning the electrodes with standard lithographic techniques, make this detector particularly suitable for X-ray beam monitors where the intensity and the position of the photon beam needs to be measured with minimal effect on the beam itself (i.e. in-line and highly transmissive measurement). The steps needed to realize our novel detectors together with a new Graphene Oxide (GO) rapid thermal reduction process are described and the results of preliminary X-ray tests reported.