We investigate the memory function at room temperature in devices based on quantum dots. By Low Pressure Chemical Vapour Deposition (LPCVD) we deposited Si dots embedded in SiO2. On these devices flat band voltage shifts were well detected at low write voltages for write times of the order of milliseconds, and furthermore, a plateau in the flat band voltage shift, maybe consequence of Coulomb blockdale, was observed.

Crupi, I., Lombardo, S., Gerardi, C., Ammendola, G., Vulpio, M., Rimini, E., et al. (2002). Memory effects in single-electron nanostructures. In Solid State Phenomena (pp.669-674). Trans Tech Publications Ltd.

Memory effects in single-electron nanostructures

Crupi, Isodiana;
2002-01-01

Abstract

We investigate the memory function at room temperature in devices based on quantum dots. By Low Pressure Chemical Vapour Deposition (LPCVD) we deposited Si dots embedded in SiO2. On these devices flat band voltage shifts were well detected at low write voltages for write times of the order of milliseconds, and furthermore, a plateau in the flat band voltage shift, maybe consequence of Coulomb blockdale, was observed.
Settore ING-INF/01 - Elettronica
Gettering and Defect Engineering in Semiconductor Technology 2001
S. Tecla, ita
2001
2002
6
http://www.ttp.net
Crupi, I., Lombardo, S., Gerardi, C., Ammendola, G., Vulpio, M., Rimini, E., et al. (2002). Memory effects in single-electron nanostructures. In Solid State Phenomena (pp.669-674). Trans Tech Publications Ltd.
Proceedings (atti dei congressi)
Crupi, I.; Lombardo, S.; Gerardi, C.; Ammendola, G.; Vulpio, M.; Rimini, E.; Melanotte, M.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10447/179618
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