The crystal quality of CdZnTe (CZT) was investigated by using high-energy transmission x-ray diffraction techniques. CdZnTe had shown excellent performance in hard hard x-ray and gamma detection. Collimated high-energy x-rays, produced by a superconducting wiggler at the National Synchrotron Light Source's X17B1 beamline, allow for a nondestructive characterization of thick CZT samples. The study lead to understanding the effects of defects on the device performances and ultimately to improving the quality CZT material required for device fabrication.
|Data di pubblicazione:||2005|
|Titolo:||High-energy X-ray diffraction and topography investigation of CdZnTe|
|Autori:||G CARINI; G CAMARDA; Z ZHONG; DP SIDDONS; AE BOLOTNIKOV; GW WRIGHT; B BARBER; ARNONE C; RB JAMES|
|Tipologia:||Articolo su rivista|
|Citazione:||G CARINI, G CAMARDA, Z ZHONG, DP SIDDONS, AE BOLOTNIKOV, GW WRIGHT, et al. (2005). High-energy X-ray diffraction and topography investigation of CdZnTe. JOURNAL OF ELECTRONIC MATERIALS, 34, 804-810.|
|Appare nelle tipologie:||01 - Articolo su rivista|