Archivio istituzionale della ricerca dell'Università degli Studi di Palermo

Sfoglia per Autore  

Opzioni
Mostrati risultati da 21 a 40 di 140
Data di pubblicazione Titolo Autori Tipologia Autore(i) File
1-gen-2007 Electron paramagnetic resonance investigation on the hyperfine structure of the E'δ center in amorphous silicon dioxide BUSCARINO, GianpieroAGNELLO, SimonpietroPARLATO, AldoGELARDI, Franco Mario 01 - Contributo in rivista::1.01 Articolo in rivista BUSCARINO G; AGNELLO S; GELARDI FM; PARLATO A
1-gen-2007 Experimental evidence of E’_gamma centers generation from oxygen vacancies in a-SiO2 BUSCARINO, GianpieroAGNELLO, Simonpietro 01 - Contributo in rivista::1.01 Articolo in rivista BUSCARINO G; AGNELLO S
1-gen-2007 Structural inhomogeneity of Ge-doped amorphous SiO2 probed by photoluminescence lifetime measurements under synchrotron radiation AGNELLO, SimonpietroBUSCARINO, GianpieroCANNAS, MarcoMESSINA, Fabrizio + 01 - Contributo in rivista::1.01 Articolo in rivista AGNELLO S; BUSCARINO G; CANNAS M; MESSINA F; GRANDI S; MAGISTRIS A
1-gen-2007 Electron paramagnetic resonance line shape investigation of the Si-29 hyperfine doublet of the E'γ center in a-SiO2 Buscarino G.Agnello SimonpietroParlato Aldo 01 - Contributo in rivista::1.01 Articolo in rivista Buscarino G.; Agnello Simonpietro; Parlato Aldo;
1-gen-2008 Optical absorption and electron paramagnetic resonance of the E’_alfa center in amorphous silicon dioxide BUSCARINO, GianpieroBOSCAINO, RobertoAGNELLO, SimonpietroGELARDI, Franco Mario 01 - Contributo in rivista::1.01 Articolo in rivista BUSCARINO G; BOSCAINO R; AGNELLO S; GELARDI FM
1-gen-2008 Optical absorption band at 5.8 eV associated with the E’_gamma centers in amorphous silicon dioxide: Optical absorption and EPR measurements AGNELLO, SimonpietroBUSCARINO, GianpieroGELARDI, Franco MarioBOSCAINO, Roberto 01 - Contributo in rivista::1.01 Articolo in rivista AGNELLO S; BUSCARINO G; GELARDI FM; BOSCAINO R
1-gen-2008 Variability of the Si-O-Si angle in amorphous SiO2 probed by electron paramagnetic resonance and Raman spectroscopy VACCARO, GianfrancoBUSCARINO, GianpieroAGNELLO, SimonpietroGELARDI, Franco Mario 10 - Proceedings::Proceedings Vaccaro, G; Buscarino, G; Agnello, S; Gelardi, FM
1-gen-2009 Variability of the Si–O–Si angle in amorphous-SiO2 probed by electron paramagnetic resonance and Raman spectroscopy BUSCARINO, GianpieroVACCARO, GianfrancoAGNELLO, SimonpietroGELARDI, Franco Mario 01 - Contributo in rivista::1.01 Articolo in rivista Buscarino, G; Vaccaro, G; Agnello, S; Gelardi, FM
1-gen-2009 Photosensitivity of SiO2–Al and SiO2–Na glasses under ArF (193 nm) laser BUSCARINO, Gianpiero + 01 - Contributo in rivista::1.01 Articolo in rivista Trukhin, AN; Teteris, J; Fedotov, A; Griscom, DL; Buscarino, G
1-gen-2009 Structural modifications induced by electron irradiation in SiO2 glass: Local densification measurements BUSCARINO, GianpieroAGNELLO, SimonpietroGELARDI, Franco Mario 01 - Contributo in rivista::1.01 Articolo in rivista Buscarino, G; Agnello, S; Gelardi, FM
1-gen-2009 29Si attribution of the 1.3 mT hyperfine structure of the E’_gamma centers in amorphous SiO2 VACCARO, GianfrancoAGNELLO, SimonpietroBUSCARINO, GianpieroNUCCIO, Laura + 01 - Contributo in rivista::1.01 Articolo in rivista VACCARO G; AGNELLO S; BUSCARINO G; NUCCIO L; GRANDI S; MUSTARELLI P
1-gen-2009 Polyamorphic transformation induced by electron irradiation in a-SiO2 glass BUSCARINO, GianpieroAGNELLO, SimonpietroGELARDI, Franco MarioBOSCAINO, Roberto 01 - Contributo in rivista::1.01 Articolo in rivista Buscarino, G; Agnello, S; Gelardi, FM; Boscaino, R
1-gen-2010 Structural and luminescence properties of amorphous SiO2 nanoparticles VACCARO, GianfrancoAGNELLO, SimonpietroBUSCARINO, GianpieroCANNAS, MarcoVACCARO, Lavinia 10 - Proceedings::Proceedings Vaccaro, G; Agnello, S; Buscarino, G; Cannas, M; Vaccaro, L
1-gen-2010 Atomic force microscopy and Raman investigation on the sintering process of amorphous SiO2 nanoparticles BUSCARINO, GianpieroVACCARO, GianfrancoAGNELLO, SimonpietroGELARDI, Franco Mario + 01 - Contributo in rivista::1.01 Articolo in rivista Buscarino, G; Ardizzone, V; Vaccaro, G; Agnello, S; Gelardi, FM
1-gen-2010 Wide range excitation of visible luminescence in nanosilica VACCARO, LaviniaVACCARO, GianfrancoAGNELLO, SimonpietroBUSCARINO, GianpieroCANNAS, Marco 01 - Contributo in rivista::1.01 Articolo in rivista Vaccaro, L; Vaccaro, G; Agnello, S; Buscarino, G; Cannas, M
1-gen-2010 Thermally Induced Structural Modification of Silica Nanoparticles Investigated by Raman and Infrared Absorption Spectroscopies VACCARO, GianfrancoAGNELLO, SimonpietroBUSCARINO, GianpieroGELARDI, Franco Mario 01 - Contributo in rivista::1.01 Articolo in rivista Vaccaro, G; Agnello, S; Buscarino, G; Gelardi, FM
1-gen-2010 The role of impurities in the irradiation induced densification of amorphous SiO2 BUSCARINO, GianpieroAGNELLO, SimonpietroGELARDI, Franco MarioBOSCAINO, Roberto 01 - Contributo in rivista::1.01 Articolo in rivista Buscarino, G; Agnello, S; Gelardi, FM; Boscaino, R
1-gen-2010 Structural properties of the range-II- and range-III order in amorphous-SiO2 probed by electron paramagnetic resonance and Raman spectroscopy VACCARO, GianfrancoBUSCARINO, GianpieroAGNELLO, SimonpietroGELARDI, Franco Mario + 01 - Contributo in rivista::1.01 Articolo in rivista Vaccaro, G; Buscarino, G; Agnello, S; Messina, G; Carpanese, M; Gelardi, FM
1-gen-2011 Preparation and photoactivity of samarium loaded anatase, brookite and rutile catalysts BELLARDITA, MariannaDI PAOLA, AgatinoPALMISANO, LeonardoPARRINO, FrancescoBUSCARINO, Gianpiero + 01 - Contributo in rivista::1.01 Articolo in rivista Bellardita, M; Di Paola, A; Palmisano, L; Parrino, F; Buscarino, G; Amadelli, R
1-gen-2011 Structural and luminescence properties of amorphous SiO2 nanoparticles VACCARO, GianfrancoAGNELLO, SimonpietroBUSCARINO, GianpieroCANNAS, MarcoVACCARO, Lavinia 01 - Contributo in rivista::1.01 Articolo in rivista Vaccaro, G; Agnello, S; Buscarino, G; Cannas, M; Vaccaro, L
Mostrati risultati da 21 a 40 di 140
Legenda icone

  •  file ad accesso aperto
  •  file disponibili sulla rete interna
  •  file disponibili agli utenti autorizzati
  •  file disponibili solo agli amministratori
  •  file sotto embargo
  •  nessun file disponibile