Organic field-effect transistors were fabricated using an electrochemical route. The dielectric oxide was grown by anodization of a Ti:Si alloy, while 3,4-polyethylenedioxythiophene has been employed as a semiconducting polymer. OutputI-Vcharacteristics showed a transistor effect dependent on dielectric thickness. Fitting between I-V measurements and theoretical simulations in the triode region confirmed the presence of a conduction path through the polymer which degrades the electrical characteristics of the devices.

Mosca, M., Macaluso, R., Randazzo, G., Di Bella, M., Caruso, F., Cali', C., et al. (2014). Anodized Ti-Si Alloy as Gate Oxide of Electrochemically-Fabricated Organic Field-Effect Transistors. ECS SOLID STATE LETTERS, 3(1), P7-P9 [10.1149/2.007401ssl].

Anodized Ti-Si Alloy as Gate Oxide of Electrochemically-Fabricated Organic Field-Effect Transistors

MOSCA, Mauro;MACALUSO, Roberto;CARUSO, Fulvio;CALI', Claudio;DI FRANCO, Francesco;SANTAMARIA, Monica;DI QUARTO, Francesco
2014-01-01

Abstract

Organic field-effect transistors were fabricated using an electrochemical route. The dielectric oxide was grown by anodization of a Ti:Si alloy, while 3,4-polyethylenedioxythiophene has been employed as a semiconducting polymer. OutputI-Vcharacteristics showed a transistor effect dependent on dielectric thickness. Fitting between I-V measurements and theoretical simulations in the triode region confirmed the presence of a conduction path through the polymer which degrades the electrical characteristics of the devices.
2014
Settore ING-INF/01 - Elettronica
Settore ING-IND/23 - Chimica Fisica Applicata
Mosca, M., Macaluso, R., Randazzo, G., Di Bella, M., Caruso, F., Cali', C., et al. (2014). Anodized Ti-Si Alloy as Gate Oxide of Electrochemically-Fabricated Organic Field-Effect Transistors. ECS SOLID STATE LETTERS, 3(1), P7-P9 [10.1149/2.007401ssl].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10447/89588
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