We are developing a method to build arrays of Ge-based microcalorimeters for soft X-rays detection using micro-photolithographic techniques. A key element of the process is the electrical and thermal connection between the germanium sensors and the interconnection electrical tracks, that lay on a substrate acting as mechanical support and thermal sink. The geometry of the sensors, that have a square base truncated pyramid shape, makes feasible a connection through indium soldering. We describe a technique, based on microlithography and electroplating, adopted to grow indium bumps of a few tens of square microns of area and several microns high on top of the contact pads patterned on the substrate. The sensor array is placed over the bumps and a subsequent baking melts the indium, soldering the sensors to the pads.

Lo Cicero, U., Arnone, C., Barbera, M., Collura, A., Lullo, G. (2012). Electroplated Indium Bumps as Thermal and Electrical Connections of NTD-Ge Sensors for the Fabrication of Microcalorimeter Arrays. JOURNAL OF LOW TEMPERATURE PHYSICS, 167(3-4), 535-540 [10.1007/s10909-012-0560-4].

Electroplated Indium Bumps as Thermal and Electrical Connections of NTD-Ge Sensors for the Fabrication of Microcalorimeter Arrays

ARNONE, Claudio;BARBERA, Marco;LULLO, Giuseppe
2012-01-01

Abstract

We are developing a method to build arrays of Ge-based microcalorimeters for soft X-rays detection using micro-photolithographic techniques. A key element of the process is the electrical and thermal connection between the germanium sensors and the interconnection electrical tracks, that lay on a substrate acting as mechanical support and thermal sink. The geometry of the sensors, that have a square base truncated pyramid shape, makes feasible a connection through indium soldering. We describe a technique, based on microlithography and electroplating, adopted to grow indium bumps of a few tens of square microns of area and several microns high on top of the contact pads patterned on the substrate. The sensor array is placed over the bumps and a subsequent baking melts the indium, soldering the sensors to the pads.
2012
Settore ING-INF/01 - Elettronica
Lo Cicero, U., Arnone, C., Barbera, M., Collura, A., Lullo, G. (2012). Electroplated Indium Bumps as Thermal and Electrical Connections of NTD-Ge Sensors for the Fabrication of Microcalorimeter Arrays. JOURNAL OF LOW TEMPERATURE PHYSICS, 167(3-4), 535-540 [10.1007/s10909-012-0560-4].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10447/63649
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