An analysis of the electronic properties of Ta2O5 / electrolyte junction is reported for thin film (≤ 14 nm) grown on tantalum in acidic electrolyte. The investigation is carried out by the synergetic use of three techniques: Photocurrent Spectroscopy (PCS), Electrochemical Impedance Spectroscopy (EIS) and Differential Admittance (DA) measurements. PCS is a non destructive optical technique based on the analysis of the electrochemical response (photocurrent or photopotential) of the electrode/electrolyte interface under irradiation with photons of suitable energy. PCS can provide information on the energetic of metal/oxide/electrolyte interfaces (flat band potential determination, conduction and valence band edges location). EIS allows to model the electrochemical behaviour of the oxide/electrolyte interface and DA measurements allow to get information on the tantalum grown in the investigated conditions.

FIGA' V (2007). Physico-Chemical Characterization of Ta2O5 Thin Films/Electrolyte Junctions. In ICTON Mediterranean Winter Conference, 2007. ICTON-MW 2007 (pp.1-4) [10.1109/ICTONMW.2007.4446965].

Physico-Chemical Characterization of Ta2O5 Thin Films/Electrolyte Junctions

FIGA', Viviana
2007-01-01

Abstract

An analysis of the electronic properties of Ta2O5 / electrolyte junction is reported for thin film (≤ 14 nm) grown on tantalum in acidic electrolyte. The investigation is carried out by the synergetic use of three techniques: Photocurrent Spectroscopy (PCS), Electrochemical Impedance Spectroscopy (EIS) and Differential Admittance (DA) measurements. PCS is a non destructive optical technique based on the analysis of the electrochemical response (photocurrent or photopotential) of the electrode/electrolyte interface under irradiation with photons of suitable energy. PCS can provide information on the energetic of metal/oxide/electrolyte interfaces (flat band potential determination, conduction and valence band edges location). EIS allows to model the electrochemical behaviour of the oxide/electrolyte interface and DA measurements allow to get information on the tantalum grown in the investigated conditions.
International Conference on Transparent Optical Networks- Mediterranean Winter 2007
Sousse (TUNISIA)
6-8 Dec
2007
4
FIGA' V (2007). Physico-Chemical Characterization of Ta2O5 Thin Films/Electrolyte Junctions. In ICTON Mediterranean Winter Conference, 2007. ICTON-MW 2007 (pp.1-4) [10.1109/ICTONMW.2007.4446965].
Proceedings (atti dei congressi)
FIGA' V
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10447/16554
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