MOSCA M, A CASTIGLIA, H-J BUEHLMANN, J DORSAZ, E FELTIN, J-F CARLIN, et al. (2008). Suppression of leakage currents in GaN-based LEDs induced by reactive-ion etching damages. THE EUROPEAN PHYSICAL JOURNAL. APPLIED PHYSICS, 43, 51-53.

Suppression of leakage currents in GaN-based LEDs induced by reactive-ion etching damages

MOSCA, Mauro;CASTIGLIA, Antonino Francesco;
2008-01-01

2008
MOSCA M, A CASTIGLIA, H-J BUEHLMANN, J DORSAZ, E FELTIN, J-F CARLIN, et al. (2008). Suppression of leakage currents in GaN-based LEDs induced by reactive-ion etching damages. THE EUROPEAN PHYSICAL JOURNAL. APPLIED PHYSICS, 43, 51-53.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10447/12102
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